将新的Linux kernel中的MTD test加入到旧的kernel中

原文地址：http://hi.baidu.com/serial_story/blog/calendar/201002

Linux Kernel自从2.6.29之后，就加入了MTD test模块，即几个测试模块，用于测试你的mtd的特性。

分别是：

mtd_oobtest.c //测试oob数据读写是否正常
mtd_pagetest.c //测试page读写
mtd_readtest.c //测试读功能
mtd_speedtest.c //测试mtd的速度
mtd_stresstest.c //压力测试
mtd_subpagetest.c //子页面（如果支持的话，此处我的是MLC，不支持sub page）
mtd_torturetest.c //扭曲测试？ 反正就是对mtd“严刑拷打”，看看其能经受多少读写，直至挂掉。。，所以，作者说了，除非你知道自己在干啥，否则不要随意进行这个测试。

其中，最有用的就是speed test了，方便了开发者用来测试你的mtd（我的此处是nand flash）的读/写/擦除块的速度。

我当前用的Linux kernel是2.6.28.4，没有加入MTD test，所以自己加入：

（1）下载mtd tests源码，并加入到自己的内核中，编译成.ko模块用于后期动态加载：

我这里是从最新内核linux-2.6.32.8：

中的/drivers/mtd/test里面抽取的，然后放到自己的kernel源码中：

/drivers/mtd/test，再把

config MTD_TESTS
tristate "MTD tests support"
depends on m
help
This option includes various MTD tests into compilation. The tests
should normally be compiled as kernel modules. The modules perform
various checks and verifications when loaded.
加入到Kconfig中，把

obj-y   += tests/

加入到Makefile中。然后make ARCH=arm menuconfig，去把mtd test选上：

Device Drivers --->

<*> Memory Technology Device (MTD) support --->

   MTD tests support

再编译一下：

make ARCH=arm; make ARCH=arm uImage

就可以生成对应的.ko模块文件了。

（2）.如何使用MTD test：

进入Kernel后，使用也很简单

比如：insmod mtd_speedtest.ko dev=3

注:此处的dev指的是你mtd设备number，我这里的：

# cat /proc/mtd
dev:    size   erasesize name
mtd0: 00100000 00080000 "U-Boot"
mtd1: 00800000 00080000 "Kernel"
mtd2: 0c800000 00080000 "Root filesystem"
mtd3: 04000000 00080000 "Temp"
mtd4: 69000000 00080000 "Data"

dev=3，就是mtd3，就是上面的Temp分区。

（3）举例如何使用：

最后列举一些测试结果如下：

# ls
mtd_oobtest.ko          mtd_readtest.ko         mtd_subpagetest.ko
mtd_speedtest.ko        mtd_torturetest.ko
mtd_pagetest.ko         mtd_stresstest.ko
# insmod mtd_speedtest.ko dev=3

=================================================
mtd_speedtest: MTD device: 3
mtd_speedtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_speedtest: scanning for bad eraseblocks
mtd_speedtest: scanned 128 eraseblocks, 0 are bad
mtd_speedtest: testing eraseblock write speed
mtd_speedtest: eraseblock write speed is 1754 KiB/s
mtd_speedtest: testing eraseblock read speed
mtd_speedtest: eraseblock read speed is 2443 KiB/s
mtd_speedtest: testing page write speed
mtd_speedtest: page write speed is 1748 KiB/s
mtd_speedtest: testing page read speed
mtd_speedtest: page read speed is 2439 KiB/s
mtd_speedtest: testing 2 page write speed
mtd_speedtest: 2 page write speed is 1751 KiB/s
mtd_speedtest: testing 2 page read speed
mtd_speedtest: 2 page read speed is 2440 KiB/s
mtd_speedtest: Testing erase speed
mtd_speedtest: erase speed is 439838 KiB/s
mtd_speedtest: finished
=================================================

# insmod mtd_oobtest.ko dev=3

=================================================
mtd_oobtest: MTD device: 3
mtd_oobtest: MTD device size 67108864, eraseblock size 524288, page size 4096, count of eraseblocks 128, pages per eraseblock 128, OOB size 128
mtd_oobtest: scanning for bad eraseblocks
mtd_oobtest: scanned 128 eraseblocks, 0 are bad
mtd_oobtest: test 1 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 2 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 3 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 128 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 128 eraseblocks
mtd_oobtest: test 4 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: attempting to start write past end of OOB
mtd_oobtest: an error is expected...
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to start read past end of OOB
mtd_oobtest: an error is expected...
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected...
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected...
mtd_oobtest: error: read past end of device
mtd_oobtest: attempting to write past end of device
mtd_oobtest: an error is expected...
mtd_oobtest: error occurred as expected
mtd_oobtest: attempting to read past end of device
mtd_oobtest: an error is expected...
mtd_oobtest: error: read past end of device
mtd_oobtest: test 5 of 5
mtd_oobtest: erasing whole device
mtd_oobtest: erased 128 eraseblocks
mtd_oobtest: writing OOBs of whole device
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written up to eraseblock 0
mtd_oobtest: written 127 eraseblocks
mtd_oobtest: verifying all eraseblocks
mtd_oobtest: verified up to eraseblock 0
mtd_oobtest: verified 127 eraseblocks
mtd_oobtest: finished with 2 errors
=================================================

［附录］

1.MTD tests